Model:
Patented non-marking probe socket design.
Touchscreen user interface.
Supports SD 3.0 high-speed read/write testing and duplication.
The TS-TFH50 series features full-tray flip-in and push-out mechanisms, achieving 20–30 times higher efficiency compared to traditional manual insertion and removal. This significantly enhances production throughput while reducing labor costs. Utilizing probe-based contact, it ensures zero physical marks during operation and offers the most accurate memory card testing tools available.
Touchscreen Operation: Built-in touchscreen provides simple control and clear display of operational status.
50-Port Tray: Designed to support full-tray operation.
Multi-Core Multitasking: Copying, verification, memory quality testing, and formatting
can run independently in parallel.
Durable Probe Contact: High-longevity probes ensure no physical marks on the
With its probe design, there is no need to worry about scratches on MicroSD cards during batch testing.
Easily swap disks—120 Micro SD cards can be swapped in just 3 seconds.
No need for one-by-one plugging and unplugging like traditional devices.
Two detection modes are available for customers to choose from, and read-write detection can be performed in accordance with order standards.
Landline Phone: +86-0755-25916981
Inquiry Phone Number / Whatsapp: +86-138-2315-8140
E-Mail: info@jawinmedia.com
Address: Building 1, Kailifang Plaza, Intersection of Hongde Road and Lianrun Road, Dalang Street, Longhua District, Shenzhen
